Used KLA / TENCOR / PROMETRIX UV 1080 #9269382 for sale

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KLA / TENCOR / PROMETRIX UV 1080
Sold
ID: 9269382
Vintage: 1999
Thin film measurement system 1999 vintage.
KLA / TENCOR / PROMETRIX UV 1080 is a next-generation wafer testing and metrology equipment designed for high-performance, precision applications. This system is capable of capturing up to 1080 images simultaneously for rapid defect inspection and accurate measurements of features on wafers. The unit features an extreme ultraviolet (EUV) source that provides superior resolution when imaging at deep submicron feature sizes. The 10 x zoom optics and 5-axis table offer a range of field sizes and resolution levels, enabling fast and accurate data acquisition. The machine utilizes advanced image processing algorithms to accurately identify and characterize defects. This tool is capable of automated defect analysis, providing detailed analysis and reporting of any defects detected. The asset has the ability to correlate defects with process history so that root cause investigations can be completed in a timely manner. Additionally, the model can be used to evaluate both substrates and ICs with very high precision. The equipment also offers advanced data acquisition capabilities which enable complete wafer measurements to be captured. This includes the ability to measure critical parameters such as CD, overlay, critical dimension, reticle, or network changes. The system is also highly modular, allowing for increased flexibility and customization in the areas of optical performance, image analysis and data collection. KLA UV 1080 has been designed for low particle and defect counts, ensuring wafers are free from contamination and any abnormalities can easily be identified. Additional features such as short cycle time and minimized downtime due to automated tool repair help decrease processing time and cost. The maintenance burden is also reduced as the unit offers remote diagnostics and user-friendly interface. In summary, TENCOR UV-1080 is an advanced wafer testing and metrology machine designed to offer superior performance. Its flexible design and array of features help offer a complete solution to wafer inspection and measurement applications. Its streamlined design reduces downtime and processing costs while at the same time guaranteeing superior accuracy and repeatability.
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