Used KLA / TENCOR / PROMETRIX UV 1080 #9275986 for sale

KLA / TENCOR / PROMETRIX UV 1080 is a wafer testing and metrology equipment that utilizes advanced optics, imaging technology, and software to provide an accurate model of the surface topography of a wafer. It is designed to take a highly accurate 3D map of a wafer's surface morphology, allowing engineers to measure a variety of attributes such as the presence of defects and particles, as well as the thickness and uniformity of the film layers. KLA UV 1080 uses a specialty microscope lens which combines a selectable condenser aperture, adjustable microscope objectives, and a high resolution cameras to simultaneously capture multiple points across the surface of the wafer. The output of this system is a unique, real-time image which is then translated into a digital map. This data is then fed into specialized software which uses algorithms to analyze the data and generate a comprehensive report on the condition of the wafer. In addition to optical imaging, TENCOR UV-1080 also utilizes a variety of specialized metrology techniques such as scanning electron microscopy (SEM), X-ray diffraction (XRD) and other custom techniques which are designed to measure the thickness of film layers and any defects or contaminants present. The unit also has a wide measuring range, allowing for the detection of particles as small as 1 nanometer and measuring up to 4 microns with a 3-dimensional solution. To provide a comprehensive overview of the surface structure and condition of a wafer, UV-1080 is engineered to optimize accuracy, repeatability, and flexibility across a range of wafers. The machine includes a comprehensive suite of user-friendly software and control options, allowing users to adjust and customize the measurement parameters. As part of its data collection process, the tool also automatically stores previous test results, allowing for comparison and review of both past and new measurements. PROMETRIX UV 1080 has been designed to provide an excellent level of detail, accuracy, and reliability for industrial materials characterization and defect detection. By combining advanced optics technology, comprehensive software, and specialized metrology techniques, this asset is an invaluable tool for the efficient and reliable assessment of substrate surfaces.