Used KLA / TENCOR / PROMETRIX UV 1280SE #195817 for sale

KLA / TENCOR / PROMETRIX UV 1280SE is an advanced wafer testing and metrology equipment designed for high throughput applications on compound semiconductor substrates. The system is equipped with state-of-the-art UV light sources enabling non-destructive in-line metrology and analysis. With its high accuracy and precision, KLA UV-1280SE is an ideal tool for measuring the electrical properties of a substrate with minimal time and effort. The unit is equipped with two beam systems - the UV and visible range - and can be used to measure many properties of semiconductor substrates including: light absorption, electrical resistance, resistivity, doping density, film thickness, and surface roughness. The instrument includes an advanced optics machine allowing for precise imaging and positioning of the optical beam with sub-micron accuracy. The two beam systems enable precise wavelength selection and a selection of rotating and tiltable stage configurations for fast and accurate measurements. TENCOR UV 1280 SE also accompanies an automated data collection and reporting tool that allows for ease of use and accurate reproducibility of data. This advanced asset allows for the collection of up tod three separate layers of data simultaneously with a single acquisition. This significantly reduces the time required to acquire data from substrates, allowing for higher throughput. The software includes advanced data manipulation features that ensure accurate data comparison when measuring multiple substrates. The integrated metrics algorithm further allows for study of correlation between substrates. The flexibility of UV-1280SE allows for configuration to fit a broad array of applications. The model includes an automated wafer loading and unloading equipment, eliminating manual loading and allowing for unattended operation. This reduces operator fatigue and ensures consistent results with minimal operator input. UV 1280 SE is a robust and reliable wafer testing and metrology system, capable of providing accurate, high-throughput results for compound semiconductor substrates. Combining high resolution imaging, fast acquisition times, and non-destructive testing, PROMETRIX UV-1280SE is the ideal instrument for the study of semiconductor substrates.