Used KLA / TENCOR RS-35 #9137627 for sale

KLA / TENCOR RS-35 is an advanced wafer testing and metrology equipment designed to provide users with precise information about the condition of semiconductor wafers. The system uses advanced optics and digital imaging to detect and measure physical anomalies in the wafer surface. Once identified, the anomalies can be assessed to determine their effects on wafer quality. The unit is based on KLA SensArray Optical Detectors, which are capable of measuring physical evidence as small as 8nm. The SensArray Detectors use high resolution digital imaging to create images of the wafer surface that are 1,000 times sharper than conventional imaging systems. The resulting images reveal any anomalies that may exist in the wafer surface, such as scratches, chips or pits. KLA RS-35 performs its measurements using the same principles as traditional optical metrology systems, but with improved speed and accuracy. The machine can perform measurements on up to 400 chips per hour, with a resolution of 1nm. This allows for faster detection of potential defects in the wafe surface. It also ensures that any damage is identified and addressed before production begins. TENCOR RS 35 also includes an integrated module for defect classification. This module utilizes an algorithm that is designed to classify detected anomalies into categories, such as pattern irregularities, resistivity variations or particle defects. This allows the user to quickly identify potentially problematic defects and take corrective measures to ensure the highest possible quality in the final product. In addition, RS-35 also includes a wafer flatness module. This module measures wafer flatness and identifies non-flat regions that may cause production issues. This module helps to ensure that wafers manufactured with the tool conform to the highest standards. RS 35 is a powerful and reliable tool for testing and metrology, providing users with an efficient and accurate method of identifying potential defects in wafers. Its advanced optics, digital imaging, and defect classification capabilities ensure that users can quickly and accurately assess the quality of their wafers.