Used MDC CV #46944 for sale

MDC CV is an automated wafer testing and metrology equipment designed for accurate and repeatable measurements of microelectronic components. It utilizes a combination of optical, electron microscopy and interferometric measurement capabilities to provide users with unprecedented accuracy and repeatability for evaluation of product properties throughout the fabrication and assembly process. The system employs a high-resolution imaging unit that uses a variety of optical and electron microscopy methods to image wafer surfaces, with lasers, an FTIR spectrometer, a Raman spectrometer and an integrated diffraction grating assembly providing maximum flexibility for sample characterization and analysis. Multiple embedded digital cameras provide an unobstructed view of the specimens, allowing for accurate measurements of features within the sample. The machine also utilizes a high-resolution pattern recognition algorithm that automates the data acquisition and analysis process, allowing for faster and more efficient sample characterization and analysis than ever before. The on-board metrology software is capable of quickly and precisely measuring wafer topography and crystallography attributes; such as surface roughness and surface patterns, as well as providing real-time analysis of individual particles and grain sizes. CV Tool also includes a fully automated wafer preparation station, which simplifies and expedites sample preparation, as well as a specialized ejection and handling asset for samples that are too small or delicate for manual manipulation. The automated station provides a faster, more efficient method of sample preparation, eliminating the need to handle the wafers manually. Finally, the model includes an integrated data management equipment, which allows for secure electronic storage and retrieval of all system data. Through this feature, the user is able to quickly and easily compare results, as well as store and share vital information with other members of their workgroup. In summary, MDC CV is an automated wafer testing and metrology unit that provides users with unprecedented accuracy and repeatability in wafer characterization and analysis. With its combination of high-resolution imaging, pattern recognition and automated sample preparation capabilities, CV machine offers users a highly versatile tool for measuring and analyzing microelectronic components.