Used NOVA NovaScan 3090 FI SB #9276192 for sale

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ID: 9276192
Film measurement system P/N: 390-00000-10 With EBARA CMP Integration metrology critical dimension EBARA REX300 CMP Tool Voltage: 115 V, 230 VAC.
NOVA NovaScan 3090 FI SB is a wafer testing and metrology equipment designed for use in a variety of industrial and scientific applications. The system uses advanced wafer testing and metrology technology to enable precise measurement of electrical and physical properties on a semiconductor wafer. With its high-resolution, high-speed imaging capabilities, the unit is capable of measuring a variety of parameters for surface roughness, etch rate, uniformity, polarization, and isolation. NovaScan 3090 FI SB allows for improved analysis of semiconductor wafers, including the ability to identify and isolate defective areas. It is capable of conducting surface analysis with its high-resolution, high-speed imaging machine, which can be used to measure a range of electrical, surface, and structure properties. In addition, the tool is equipped with a variety of features to aid in characterization, including the ability to automatically recognize material defects and areas that require additional investigation. The asset includes a variety of software support to provide seamless integration between the model and its user. Its user-friendly interface allows for easy navigation of the equipment's features, allowing operators to quickly identify areas of interest. The software also includes a variety of analysis tools, such as optical critical dimension (OCD) analysis, CD-SEM (critical dimension scanning electron microscopy) profile, and automatic secondary electron CD-SEM profile. The system is built with a range of advanced technologies, including an automated data acquisition unit and a high-speed imaging machine. This allows for accurate measurement and analysis of a variety of parameters. A variety of image capture options allows the tool to capture images of up to 10,000 pixels in resolution, which can provide detailed information about the wafer surface. The asset also includes an ion beam model to provide accurate measurements of dopant concentrations, while a robot platform allows for automated sample loading and measurement. Overall, NOVA NovaScan 3090 FI SB is a powerful and versatile wafer testing and metrology equipment designed for a variety of industrial and scientific applications. Its advanced imaging capabilities, automated data acquisition system, and range of software support makes it a valuable tool for identifying defective areas and measuring electrical, surface, and structure properties.
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