Used SEMITEST Epimet #196461 for sale

SEMITEST Epimet is a wafer testing and metrology equipment designed to provide highly accurate metrology, die sorting, and non-destructive testing of microelectronic components. The system features a fully automated 4-inch wafer test suite with a 20KV accelerating voltage, an unattended operation, and a module configuration designed for specific user process needs. Epimet's die-sort capability is designed to examine wafers for production and quality control. The unit utilizes an automated metrology machine featuring an advanced optical tool to detect flaws such as pits, scratches, or contaminants in the wafer. Its advanced sorting algorithm is designed to reliably develop a pattern on the wafer defects while also detecting electrical shorts. SEMITEST Epimet features a high-resolution optical color camera for die-stitching to ensure accurate inspection. With the 8X magnified inspections, the asset can accurately locate defects on the surface of the wafer to 1-5 microns. This ability allows users to detect sub-micron features in their semiconductor devices. Additionally, Epimet offers non-destructive testing solutions including a high-speed Optical Electrical Test (OET) which allows simultaneous electrical testing and light inspection of multiple test locations on the wafer. It also offers a coaxial current probe test for high-speed data collection. The model is designed for productivity, reliability, and long-term cost effectiveness. Its modular design allows for easy reconfiguration and enhances the capability of the test equipment to adapt to changing requirements. SEMITEST Epimet is also compatible with other test systems, so users can maximize the productivity and cost efficiency of their test processes. The system is designed to provide users with high-accuracy, high-speed, and reliable performance in the inspection and testing of microelectronic components. From die-sort and non-destructive testing applications to optical characterization and metrology, Epimet offers a comprehensive wafer testing solution.