Used THERMA-WAVE OPTIPROBE 5205 #62641 for sale

THERMA-WAVE OPTIPROBE 5205 is a wafer testing and metrology equipment that is designed as a full-featured platform for performing various types of wafer testing and metrology. It is capable of providing highly accurate data on both active and non-active wafer die and backend formats. The platform uses proven technologies to obtain accurate scanning and electrical performance profiles, as well as three-dimensional widefield optical and other optical measurements, of individual die or whole wafers. The platform is based on a rotating wafer stage and includes multiple measures to eliminate off-axis errors which optimize die-to-die repeatability and system linearity. This design makes the unit capable of precisely measuring the shape, surface, and electrical properties of individual die or whole wafers. OPTIPROBE 5205 is also equipped with a proprietary thermal wave imaging machine providing two-dimensional infrared imaging for locating die failure and hot spot identification. Multi-channel waveform acquisition further enables capturing on-wafer electrical waveforms from both device and devices connected to the gate and drain. For metrology, the tool has an integrated metrology stage that makes it suitable for performing both optical and other metrology. The metrology stage is integrated with a high-resolution video imaging asset providing magnification and focus corrections as well as topography imaging. It also can be used measured for nanometer-level optical imaging. The model has an intuitive touchscreen-based controller that streamlines operation and works seamlessly with both manual and automated operations. In addition, THERMA-WAVE OPTIPROBE 5205 is equipped with an advanced vision equipment providing pattern recognition technology and Autofocus capabilities. It can be configured to perform automated circuit measurements and software assisted die identification and position detection. This advanced vision system makes it suitable for automated failure analysis such as cross-section analysis and 3D overlay alignment. In conclusion, OPTIPROBE 5205 has advanced features that make it an ideal wafer testing and metrology unit for applications including IC packaging, MEMS, SiP and assembly. The machine also provides precise data in both active and non-active wafer formats, making it suitable for a wide range of wafer testing and metrology tasks.