Used ULVAC / PHI (Wafer Testing And Metrology) for sale

Wafer testing and metrology equipment offered by ULVAC / PHI are highly regarded in the semiconductor industry due to their precision and efficiency. ULVAC / PHI specializes in providing users with advanced solutions for wafer surface analysis and measurement. The wafer testing systems enable comprehensive analysis of wafer surfaces through techniques such as scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDS). These units are equipped with advanced software that allows for the examination of the smallest surface features, defects, and contaminants on wafers. They also facilitate quick and accurate thickness measurement, elemental analysis, and imaging of the wafers. ULVAC / PHI's metrology machines are designed to ensure the highest level of accuracy in wafer measurement. Their tools employ non-contact optical techniques such as ellipsometry and reflectometry to measure various parameters like film thickness, refractive index, and surface roughness. The metrology tools are equipped with advanced algorithms and automation features, allowing for high-throughput measurements and quick data analysis. One notable product of ULVAC / PHI is the ULVAC 4700 series, which offers comprehensive wafer measurement capabilities. The ULVAC 4700 series provides excellent accuracy in non-contact measurements of thickness, refractive index, and film composition. These assets are capable of handling various wafer sizes and can be seamlessly integrated into existing manufacturing setups. Overall, ULVAC / PHI's wafer testing and metrology models offer advanced analytical capabilities, high precision, and automation, making them ideal solutions for semiconductor manufacturers seeking reliable and efficient wafer analysis and measurement tools.