Used VEECO / SLOAN DEKTAK 3 #9010467 for sale

VEECO / SLOAN DEKTAK 3 is a highly advanced wafer testing and metrology equipment designed for use in research and development laboratories. The device utilizes a variety of technologies, including atomic force microscopy (AFM), contact force microscopy (CFM), and optical and capacitance profiling, to provide high-precision, non-contact measurements of wafer topographies. The instrument features a unique rotating stage design that allows for sample rotation as well as three axes of motion, providing a variety of useful testing capabilities. VEECO DEKTAK 3 is a fully automated system capable of running multiple tests in sequence. Its sensitive microscope-style probe technology is capable of detecting surface alteration in the range of 10 nanometers. It also has an accuracy peak-to-valley tracking feature which allows for a resolution of 10 angstroms, enabling extremely precise scanning. Other features of the device include its intuitive graphical interface, its ability to be remotely operated, and its compatibility with standard optical microscopes. At the core of SLOAN DEKTAK 3 is a high-resolution optical detection unit that employs linear, centroid, and grayscale detection methods to expose surface features. The device also contains a 0-5V programmable scanner drive and a feedback loop which utilizes capacitance sensors to track wafer topography in three dimensions. This enables the imaging of flat faces as well as complex shapes, allowing for the detection of height differences down to a few nanometers. The machine's software is also highly customizable, allowing users to save and recall test sequences, adjust the range and type of measurements taken, and graphically display results. Furthermore, DEKTAK 3's high-speed servo motors provides a steady platform that maintains steady scanning even during extreme conditions such as temperature fluctuations. Finally, the machine is compatible with a range of different accessories to expand its capabilities. Overall, VEECO / SLOAN DEKTAK 3 is an incredibly advanced wafer testing and metrology tool that provides unparalleled precision and accuracy. Its fully automated design makes it suitable for a range of research applications, while its customized controls allow for flexible testing and measurement.