Used VEECO / SLOAN DEKTAK IIA #197824 for sale

VEECO / SLOAN DEKTAK IIA wafer testing and metrology equipment is an automated and versatile metrology platform designed to address a variety of topography and nano surface characterization needs for a range of applications. The system offers low-profile, non-contact diagnostics for applications in semiconductor fabrication, research and development, and analytical surface science. VEECO DEKTAK IIA uses a capacitance-driven, non-contact stylus measurement unit suitable for correlative measurements for surface roughness and step height as well as surface resistivity/conductivity. SLOAN DEKTAK IIA implements a resistive scanning with a low 0.1-micron (10-nm) vertical resolution in order to accurately capture even the smallest topographic features on the sample. The scanning speed and contact force are adjustable, permitting the user to adjust the machine to better suit the needs of the sample being observed. DEKTAK IIA offers a dynamic range up to 1000X, allowing for accurate and repeatable measurements of high aspect ratio samples. The intuitive software package permits the user to customize the display to display contour maps, cross-sectional profiles, and other graphical representations. This allows for quick identification of morphologic features on the sample, providing the user with a comprehensive understanding of the specimen. In addition to simply measuring topographic features, VEECO / SLOAN DEKTAK IIA can also be used for a variety of wafer testing and metrology applications. This includes photolithography, plate-making, intermetal dielectric measurement, and non-contact chemical concentration measurement. VEECO DEKTAK IIA is also equipped with an optional UV light sources that allows for direct imaging of photo-resist and photoresist layer thickness. In order to ensure the most accurate results, SLOAN DEKTAK IIA also offers a wide range of sample holders for a variety of sample sizes. This ensures that the sample is securely held in place without risk of shifting during the measurement process. DEKTAK IIA is designed for automated operation, providing fast and reliable data collection for a variety of metrology needs.