Used VEECO / SLOAN DEKTAK V-200 Si #147177 for sale

VEECO / SLOAN DEKTAK V-200 Si is a high-performance wafer testing and metrology equipment that delivers unsurpassed accuracy and repeatability for measuring thickness and profile of both silicon and compound semiconductor substrates. The V-200 is designed to operate in both an automated in-line mode and a manual platform mode, enabling both rapid process measurement and characterisation of wafers. The V-200 features advanced optical detection subsystems and a highly optically accurate three-axis scanner to ensure precise motion and profile measurement. The vertical scanning range of up to 7.62mm (300 mils) and the horizontal scanning range of 15.25mm (600 mils) provide ample measurement area for large substrates. As well as accurate scanning capability, the V-200 provides a wide variety of data collection, analysis, and reporting functions for process development, production and research applications. The software permits full automation of the testing and metrology process, as well as manual control, featuring automated routines for traversing step heights, pits and peaks. The V-200 provides a number of operator-friendly features to ensure accuracy and repeatability. It features an optical platen, which provides precise dimensional reference at the sample level to eliminate alignment issues. The system also features an LED profiling unit, which provides uniform illumination and precise profile measurements across the entire measurement range. Additionally, in inline mode, precise alignment and repeatability is achieved through the use of the patented 'Auto Align Focus' process, which includes both coarse and fine adjustment functions. The V-200 is also equipped with a lens illumination machine, which produces uniform illumination and eliminate operator issues related to optics and lens quality. This tool also permits a variety of optical lenses and tricks to increase productivity. The V-200 is built on a field-proven platform, bearing quality checks performed throughout the manufacturing process to ensure long-term durability and reliability. The asset is supported by teams of highly trained engineers and technicians, providing routine maintenance and support as needed. The V-200 is a versatile, high-performance wafer testing and metrology model, capable of both rapid process measurement and in-depth characterization of wafers. With its advanced optics, advanced motion and profile scanning, intuitive user interface and automation features, the V-200 provides accurate, repeatable results quickly and easily.