Probers

ACCRETECH / TSK UF 3000EX Prober Loader unit: Left Barcode read: Yes USB: Yes Loader specification: FOUP, 12" Open, 8" Open, 12" OCR : Auto wafer ID read Prober cleaning: Touch sensor Clean pad vacuum system Card change: Auto card change Chiller type: SCU-500R Test temperature(±1°C): -40°C ~ I50°C Chiller: (-40°C ), Cooling chuck Hinge: MHF4000EXC Maximum multisite number: >256 dies Maximum cat. number: 9999 2007 vintage.

ACCRETECH / TSK UF 190A Wafer prober, 5"-8" Chuck top: 8" Gold room Ring insert: Rectangular probe card Auto probe to PAD Probe to scrubber Lamp pole GPIB Serial to TTL comm Internet (2) Wires + grounds Power: 100 V 50/60 Hz 1 Phase 15 Amps 2000 vintage.

ACCRETECH / TSK UF 2000 Prober, 5"-8" Operating system: Windows XP Software version: S5.0f.AK Chuck top: 8" Gold ambient Ring insert: Rectangular probe card Auto probe to PAD Probe to scrubber Lamp pole GPIB Serial to TTL Comm USB Internet (2) Wire + Ground 2010 vintage.

ACCRETECH / TSK UF 200SA Prober Previously docked to: TERADYNE J750 Test System OCR: E3-6 Cleaning unit: Square type Auto probe card changer Loader type: Cassette/elevator loading Temperature: Room - hot Docking interface Includes: Hinge manipulator Model: TSK MHF4000 2004 vintage.

ACCRETECH / TSK UF 3000 Auto prober Auto probe card changer Right side loader Color LCD display, 12" Cooling chuck: -40C-150C Auto pad alignment unit Cleaning pad SCU500S chiller 2006 vintage.

ACCRETECH / TSK UF 200AL Probers, 5"-8" Loading configuration: Single OCR Clean pad Card changer Chuck type: Golden Hot chuck Hot chuck controller temperature range & accuracy XY Position accuracy Pin to pad alignment Fail mark inspection Needle alignment Auto needle height setting Color LCD display Bump height setting Needle inspection Wafer mapping capability GP-IB RS232 Color display Touch screen Printer: No Off site marking: No TTL: No Currently warehoused.

ACCRETECH / TSK APM-90A Prober.

ACCRETECH / TSK APM-90A Prober.

ACCRETECH / TSK UF 3000EX Prober 2010 vintage.

ACCRETECH / TSK UF 200A/AL Probers (3) With dual OCR Clean pad Chuck type: Nickel Hot chuck Hot chuck controller XY Position accuracy Pin to pad alignment Fail mark inspection Needle alignment Auto needle height setting Color LCD display Wafer mapping capability GP-IB Color display Touch screen.

ACCRETECH / TSK UF 3000 Probers For P2000A Type: IDC Function: No PMI Function Auto needle alignment / Height option Off site marking: No Auto card changer: SACC (CardPGV / APC) Camera oblique & coaxial: Chuck camera low high power Test head frame clamp Card guide drawer: No High rigidity chuck Communication function: RS232C Signal function communication: GP-IB Driver marker: No Cleaning unit: Normal plate (Needle cleaning) Hot / Cold chuck temperature: 50-150 Internal / External printer: No Cassette Dual: No Single SACC Cart Linear scale: No TTL: No RF-TAG: No (FOUP ID) Head plate tilt function: No.

ACCRETECH / TSK APM-90A Prober Wafer sensor defect.

ACCRETECH / TSK UF 3000 Prober Right loader Fail mark inspection: No Needle inspection option: Yes Auto needle alignment option: Yes Off site marking: No Auto card changer: CardPGV or APC Camera oblique + coaxial: Yes TH clamp: Yes Card guide drawer: No High rigidity chuck: Yes RS232: No GP-IB: Yes Friver marker by category: No Cleaning unit: Normal plate Hot chuck: Yes Temp range: +50 ~ +150 degrees C Internal printer: No External printer: No Dual cassette: No Single cassette: Yes Linear scale: No TTL: No RF-TAG: No Tilting: No.

ACCRETECH / TSK UF 200A Prober, 8" Hot chuck: Ambient to 150°C Gold chuck OCR Advme7057 CPU and COGNEX board 8200 2003 vintage.

ACCRETECH / TSK UF 200A Prober, 8" Hot chuck: Ambient to 150°C Gold chuck OCR Advme7057 CPU and COGNEX board 8200 2003 vintage.

ACCRETECH / TSK UF 200A Prober, 8" Hot chuck: Ambient to 150°C Gold chuck OCR Advme7057 CPU and COGNEX board 8200.

ACCRETECH / TSK UF 200A Prober, 8" Hot chuck: Ambient to 150°C Gold chuck OCR Advme7057 CPU and COGNEX board 8200.

ACCRETECH / TSK UF 2000 Prober Hot chuck, 8" Cassette station Inspection tray GEM (SECS-1) Wafer ID Fail mark inspection Needle inspection (PMI-1) Auto needle alignment Auto needle height setting GP-IB Multi pass probing FTP (Ethernet) Soak time High rigidity chuck Micro probing Wafer figure measurement Loader correction data extended Profile sensor: Chuck edge measurement Needle camera with built in beam Backup disk Cleaning block Rectangular probe card holder Options: Test head check Cleaning (Unit + brush) Multisite Manuals CE Marked 2007 vintage.

ACCRETECH / TSK APM-90A Probers.

ACCRETECH / TSK UF 200 Prober, 8" Includes: ID Reader Headplate for Fusion CX 1999 vintage.