X-ray

NICOLET NXR 1400i X-Ray system X-Ray Source: 20-120kv (side window) Focal Spot Size: 10-60 microns (auto adjusting with power) Image Detector Type: 4" Image Intensifier Magnification: Up to 175X Field-of-view: Up to2.1" Motion Control: X/Y sample table, source Z1 / detector Z2 / zoom Z3 Variable speed joystick control Manual included 1998 vintage.

NICOLET NXR 1400i X-Ray system X-Ray Source: 20-120kv (side window) Focal Spot Size: 10-60 microns (auto adjusting with power) Image Detector Type: 4" Image Intensifier Magnification: Up to 175X Field-of-view: Up to2.1" Motion Control: X/Y sample table, source Z1 / detector Z2 / zoom Z3 Variable speed joystick control Manual included 1998 vintage.

NICOLET NXR 1400i X-Ray system X-Ray source: 20-120kv (side window) Focal spot size: 10-60 microns (auto adjusting with power) Image detector type: 4" Image Intensifier Magnification: Up to 175X Field-of-view: Up to2.1" Motion control: X/Y sample table, source Z1 / detector Z2 / zoom Z3 Variable speed joystick control Manual included 1998 vintage. RUDOLPH FE III Focus ellipsometer, 8" Dual (Multiple ) wavelength technology Small spot at multiple angles of incidence Complex multi-layer films 1996 vintage.

NICOLET NXR 1400i X-Ray system X-Ray Source: 20-120kv (side window) Focal Spot Size: 10-60 microns (auto adjusting with power) Image Detector Type: 4" Image Intensifier Magnification: Up to 175X Field-of-view: Up to2.1" Motion Control: X/Y sample table, source Z1 / detector Z2 / zoom Z3 Variable speed joystick control Manual included 1998 vintage.

NICOLET NXR 1400i X-Ray system X-Ray Source: 20-120kv (side window) Focal Spot Size: 10-60 microns (auto adjusting with power) Image Detector Type: 4" Image Intensifier Magnification: Up to 175X Field-of-view: Up to2.1" Motion Control: X/Y sample table, source Z1 / detector Z2 / zoom Z3 Variable speed joystick control Manual included 1998 vintage.

ACCENT OPTICAL / PHILIPS PLM 100 Photoluminescence mapping tool InGaAs Detector Laser: COHERENT COMPASS 315M-80 Wavelength / maximum power ratings: 0.52 to 0.53 micron, 300mW 0.73 to 0.82 micron, 20mW 1.05 to 1.06 micron, 150mW Capabilities: Process control Analysis of band-gap Ternary layer composition Layer thickness Crystal perfection.

ACCENT OPTICAL / PHILIPS PLM 150 Photoluminescence system A green doubled YAG 532 nm laser is used as the laser source The Vis 1200 is used as the visible range grating with a blazing wavelength of 750 nm The notch filter in this system should be functioning equal or better than that of the PLM 100 system System is equipped with a Laser notch filter Not certain about whether it is a holographic filter The stage is equipped with L-shaped bracket for 2-4" wafers The top surface of the stage is big enough for 6-8" wafer, when the L-shaped bracket for 2-4" wafer is removed This system is not equipped with cassette handler 2003 vintage.

ACCENT OPTICAL / PHILIPS PLM 100 Photoluminescence mapping tool InGaAs Detector Laser: COHERENT COMPASS 315M-80 Wavelength / maximum power ratings: 0.52 to 0.53 micron, 300mW 0.73 to 0.82 micron, 20mW 1.05 to 1.06 micron, 150mW Capabilities: Process control Analysis of band-gap Ternary layer composition Layer thickness Crystal perfection.

ACCENT OPTICAL / PHILIPS PLM 100 Photoluminescence mapping tool Includes: Probe source Monochromator Grating Detector Optional: Diode laser source: COHERENT Tutcore F6-980-10-450C-100-FC-M Peak wavelength: 971.8 nm Centroid: 971.9 nm FWHM: 0.5 nm 2002 vintage.

ACCENT OPTICAL / PHILIPS PLM 100 Photoluminescence mapping tool InGaAs Detector Laser: COHERENT COMPASS 315M-80 Wavelength / maximum power ratings: 0.52 to 0.53 micron, 300mW 0.73 to 0.82 micron, 20mW 1.05 to 1.06 micron, 150mW Capabilities: Process control Analysis of band-gap Ternary layer composition Layer thickness Crystal perfection.

ACCENT OPTICAL / PHILIPS PLM 100 Photoluminescence mapping tool Includes: Probe source Monochromator Grating Detector Optional: Diode laser source: COHERENT Tutcore F6-980-10-450C-100-FC-M Peak wavelength: 971.8 nm Centroid: 971.9 nm FWHM: 0.5 nm 2002 vintage.

ACCENT OPTICAL / PHILIPS PLM 100 Photoluminescence mapping tool InGaAs Detector Laser: COHERENT COMPASS 315M-80 Wavelength / maximum power ratings: 0.52 to 0.53 micron, 300mW 0.73 to 0.82 micron, 20mW 1.05 to 1.06 micron, 150mW Capabilities: Process control Analysis of band-gap Ternary layer composition Layer thickness Crystal perfection.

ACCENT OPTICAL / PHILIPS PLM 150 Photoluminescence system A green doubled YAG 532 nm laser is used as the laser source The Vis 1200 is used as the visible range grating with a blazing wavelength of 750 nm The notch filter in this system should be functioning equal or better than that of the PLM 100 system System is equipped with a Laser notch filter Not certain about whether it is a holographic filter The stage is equipped with L-shaped bracket for 2-4” wafers The top surface of the stage is big enough for 6-8” wafer, when the L-shaped bracket for 2-4” wafer is removed This system is not equipped with cassette handler 2003 vintage.

ADE NanoMapper X-ray spectrometer 2001 vintage.

AFP IMAGING GROUP Mini NDT 9992501600 Developer for X-ray.

AFP IMAGING GROUP Mini NDT 9992501600 Developer for X-ray.

AFP IMAGING GROUP Mini NDT 9992501600 Developer for X-ray.

AFP IMAGING GROUP Mini NDT 9992501600 Developer for X-ray.

HEWLETT-PACKARD / AGILENT 5DX Series 3 X-Ray system Controller: IPC 1.0 8.4 version 2 lasers 2006 vintage.

HEWLETT-PACKARD / AGILENT 5DX (5300) Series 2L X-Ray system, 1999 vintage.