Used ANDO AF 8642 D1 #293650833 for sale

Manufacturer
ANDO
Model
AF 8642 D1
ID: 293650833
Vintage: 2004
Burn-in ovens 2004 vintage.
ANDO AF 8642 D1 burn-in equipment is a reliable, high performance, and cost-effective solution for accelerated life testing and burn-in of integrated circuits. This system is designed to ensure that products are stable and reliable prior to being shipped out to customers. AF 8642 D1 unit is based on the 8642 series of burn-in systems. It features a specially designed air flow machine and adjustable airflow rates that provide uniform and reliable thermal distribution on various small and large scale devices, allowing for efficient and accurate testing of all chip types. The tool is capable of controlling temperatures from -60 to +200 degrees Celsius and can accommodate up to 16 devices simultaneously. A unique environment control asset is also included to ensure a consistent and reliable test environment. The model is controlled by a powerful SCADA interface which facilitates great ease of use for both experienced researchers and novice users. The intuitive interface features a variety of data acquisition capabilities, including access to the equipment status, temperature readings, alarms, and real-time testing data. Furthermore, the user-friendly design allows for configuration of individual device settings, scheduling of tests, and monitoring progress of tests. In addition to its impressive hardware, ANDO AF 8642 D1 system is also equipped with a wide range of sophisticated software packages to facilitate data analysis and results gathering. The unit contains a selection of software packages suitable for burn-in, testing, heat-sealing, and packaging purposes—all of which can be programmed in easy-to-use graphical user interfaces. Overall, AF 8642 D1 is a reliable, powerful, and cost-effective burn-in machine tailored to meet the needs of electronics manufacturers and research scientists alike. This tool is characterized by its robust hardware, great ease of use, and an extensive range of features that make it the optimal solution for accelerated life testing and burn-in of integrated circuits.
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