209 RESULTS FOUND FOR: used Ellipsometers
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GAERTNER: L115
Ellipsometer. -
J.A. WOOLLAM: H-VASE
Ellipsometer 1998 vintage. -
J.A. WOOLLAM: M-2000
Ellipsometer EC-400 Controller Focused M-2000 Model: X (500) Wavelengths: 193-1000nm Multiple incident angles of 45/60/75 degrees (3mm x 4.5mm Spot) Incident angle with microspot lens: 60 degree (25x50 Micron spot size) XENON FLS-350 75W Source Power module: EPM-222 WATEC WAT-902H2 Video camera Fixed angle base with rotating compensator Motorized stage: Tip / Tilt XY Mapping stage: 200mm x 200mm PC With Windows 7 enterprise OS 2005 vintage. -
PHILIPS: SD-3400
Ellipsometer Plasmos SD series thin film measurement system Nulling method / Rotating analyzer method Includes: Intergrade cleanroom compatible construction compact system Stainless steel frame With stainless steel perforated sheet metal covers Laminar flow-hood with integrated lighting 1993 vintage. -
PHILLIPS: SD-3400
Ellipsometer. -
RUDOLPH: FE 7
Film thickness measurement system, 8" 1993 vintage. -
RUDOLPH: FE III
Film thickness measurement system, 8". -
RUDOLPH: FE VII
Auto Ellipsometer, 1993 vintage. -
RUDOLPH: FE VII D
Film Thickness Measurement System, 8". -
RUDOLPH: AUTO EL
Ellipsometer, 6". -
SENTECH: 400ADV
Ellipsometer, 2008 vintage. -
SENTECH: SE 500
Ellipsometer / Reflectometer, 4". -
DNS / DAINIPPON: RE-5200
Spectroscopic ellipsometer Standard configuration Capable of measuring a curve 2008 vintage. -
PLASMOS: 2300
Ellipsometer. -
PLASMOS: SD 2002
ellipsometer. -
PHILIPS: PQ Ruby
Ellipsometer. -
RUDOLPH: FE 4
Film thickness measurement system, 8" 1995 vintage. -
RUDOLPH: FE 7
Ellipsometer. -
RUDOLPH: FE III
Dual wave auto ellipsometer, 6". -
RUDOLPH: FE III
Ellipsometer.