Ellipsometers

Ellipsometer.

Ellipsometer, 2008 vintage.

Auto Ellipsometer, 1993 vintage.

Film thickness measurement system, 8".

Film Thickness Measurement System, 8".

Film thickness measurement system, 8" 1993 vintage.

Ellipsometer Plasmos SD series thin film measurement system Nulling method / Rotating analyzer method Includes: Intergrade cleanroom compatible construction compact system Stainless steel frame With stainless steel perforated sheet metal covers Laminar flow-hood with integrated lighting 1993 vintage.

Ellipsometer EC-400 Controller Focused M-2000 Model: X (500) Wavelengths: 193-1000nm Multiple incident angles of 45/60/75 degrees (3mm x 4.5mm Spot) Incident angle with microspot lens: 60 degree (25x50 Micron spot size) XENON FLS-350 75W Source Power module: EPM-222 WATEC WAT-902H2 Video camera Fixed angle base with rotating compensator Motorized stage: Tip / Tilt XY Mapping stage: 200mm x 200mm PC With Windows 7 enterprise OS 2005 vintage.

Ellipsometer 1998 vintage.

Ellipsometer / Reflectometer, 4".

Ellipsometer.

Ellipsometer, 6".

Ellipsometer.

Ellipsometer Hard drive is nonfunctional No software 230 V, 50 Hz, 16 A 2005 vintage.

Auto Ellipsometer, 1995 vintage.

Film Thickness Measurement System, 8", 1995 vintage.

Spectroscopic ellipsometer Standard configuration Capable of measuring a curve 2008 vintage.

Film thickness measurement system, 8" 1995 vintage.

Ellipsometer.

Ellipsometer, 8".