Mask & Wafer Inspection
1710 RESULTS FOUND FOR: used Mask & Wafer Inspection
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ADVANCED METROLOGY SYSTEMS (AMS): IR3100
Etch depth measuring systems, 12". -
AMAT / APPLIED MATERIALS: SemVision CX-DR
Defect review system, 8" EDS Capability Image tilt capability ADR (Auto defect review... -
AMAT / APPLIED MATERIALS: SemVision G2
Defect review system. -
AMAT / APPLIED MATERIALS: SemVision G2
SEM Review system 2002 vintage. -
AMAT / APPLIED MATERIALS: Compass
Patterned wafer inspection system. -
AMAT / APPLIED MATERIALS: Compass Pro
Wafer inspection systems, 12". -
AMAT / APPLIED MATERIALS: Compass Pro 300
Patterned wafer inspection systems, 12". -
ASM: MP-TAB
Singulation machine 2012 vintage. -
BROWN & SHARPE: One 775
Coordinate measurement system Range: 700 x 700 x 500 mm (XYZ) Controller: DCC TesaSta... -
AUROS TECHNOLOGY: API-2500
PSS Wafer inspection. -
BROOKS AUTOMATION: 3L
Macro inspection system. -
BIO-RAD: Quaestor Q8
Wafer inspection system, 8" FTIR Open cassettes. -
E+H METROLOGY: MX203-6
Wafer geometry system, 6". -
ESTEK / ADE: AWIS
Inspection system, 12" 2004 vintage. -
HITACHI: IS 3002
Pattern inspection system. -
INTELLEMETRICS: IL-500
Optical thickness monitor. -
IRVINE OPTICAL: Ultrastation 3B
Wafer Inspection system with wafer loader, 3"-6" Nikon optics including 10x, 20x, 40x... -
HMI: eScan 315
E-Beam inspection system. -
KEM / KOKUSAI: VR-70
Resistivity measurement system. -
KLA / TENCOR: Archer 10 XT
Overlay inspection system, 8" Process: DSW Wafers Software version 5.50.03 P04 - Win-...