Used RUDOLPH (Mask & Wafer Inspection) for sale

Rudolph Technologies is a global manufacturer of advanced semiconductor process control equipment for mask and wafer inspection. Their range of mask and wafer inspection systems includes WV 320, NSX 105, and Waferview 320, among others. The WV 320 is an advanced mask inspection system that offers excellent resolution and sensitivity for detecting small defects on photomasks. It utilizes broadband UV inspection technology combined with advanced algorithms to provide accurate defect classification and characterization. The WV 320 ensures improved yield and enhanced reliability in semiconductor manufacturing. The NSX 105 is a high-performance wafer inspection system designed to detect and classify defects on wafers. It uses advanced optical technology and image processing algorithms to provide rapid and accurate inspection results. With its large field-of-view and high throughput, the NSX 105 enables efficient defect detection during wafer production, reducing yield loss and improving process control. The Waferview 320 is a versatile wafer inspection system that offers comprehensive defect review capabilities. It combines bright field and dark field inspection techniques, providing detailed information about defect size, shape, and location. The Waferview 320 is ideal for both front-end and back-end wafer inspection, enabling quick and reliable defect detection throughout the semiconductor manufacturing process. Overall, Rudolph's mask and wafer inspection systems offer advanced technologies, high-resolution imaging, and robust algorithms for accurate and efficient defect detection. These systems help semiconductor manufacturers improve yield, reduce costs, and enhance process control.