Used RUDOLPH Waferview 320 for sale

Mask & Wafer Inspection

Manufacturer

RUDOLPH

Model

Waferview 320

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Macro defect inspection system EFEM 2006 vintage.

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Macro defect inspection system EFEM Load port 2006 vintage.

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Macro defect inspection system, 12" 2005 vintage.

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Macro defect inspection system, 12" 2006 vintage.

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