Used RUDOLPH Waferview 320 #9311788 for sale

RUDOLPH Waferview 320 is a cutting-edge mask and wafer inspection equipment designed for use in semiconductor fabrication plants. The system is highly automated, featuring various vision and wafer inspection technologies to detect and diagnose any present defects and offer manufacturers unprecedented control over the production process. From measuring die size to analyzing particles, RUDOLPH Waferview unit offers unparalleled accuracy and reliability. The machine is optimized for use with both optical and X-ray wafer inspection technology. Waferview 320 uses variable incidence angle illumination to capture consistent images for review and measurement. In addition, the tool features a 12" Automated Defect Review Turntable, and is equipped with a precision linear stage that allows for automated alignment of wafers. Additionally, the asset's macro device recognition capability and pattern recognition capabilities permit fast and efficient inspection processes. RUDOLPH Waferview 320 also offers a range of advanced features designed to ensure precise results every time. Utilizing RUDOLPH patented Multimode capabilities, users are able to quickly and easily change between various inspections modes depending on their needs. Waferview 320 also offers advanced techniques for defect analysis and characterization, including particle analysis, 3D measuring or axis recognition, as well as advanced defect area measurement with multi-level patches and dual-channel detections. RUDOLPH Waferview 320 is also highly customizable. The model can be tailored to meet the needs of users in any industry, offering a variety of options to suit individual applications. Waferview 320 can also be adapted to a range of lab configurations and production requirements, ensures easy maintenance and upgrades over time. Finally, RUDOLPH Waferview 320 is a robust equipment that provides users with unprecedented accuracy and reliability throughout the entire inspection process. Whether used for general automation, test driving, wafer-level analysis, particle measurement, or defect characterization, Waferview 320 is an asset to any semiconductor fabrication plant. In addition, the system's intuitive user interface and fast processing speed make it easy to use for everyone, no matter their level of experience.