X-ray

in-line 3D X-ray machines Bar codereader Multi-link workstation Max board size: 457x609mm 2000 vintage.

X-ray generator.

Wafer / Disk analyzer, 6"-8" 5 Standard elements for measuring: Ti, TiW(90/10), Au, TiW/Au (layer 1 TiW & layer 2 Au), Ti/Au(layer 1 Ti & layer 2 Au) Each correlation parts with (3) different thickness for measurement check Applied to semiconductor / drive IC front end process of bumping Configuration: Main body: Measuring stage with vacuum function by X-ray Main column and chamber Single chamber only Manual wafer transfer robot unit Display unit: Monitor shows statistic character on monitor Power transformer BOC EDWARDS IL70 dry pump Chiller: Yes Utilities: CDA N2 PCW Main M/C Holders, 6"-8" X-Ray tube Ti Goniometer Scanning goniometer Heat exchanger High voltage transformer Automatic voltage regulation Manual L/UL Control and vision system: Control system: PC Based with RS232 port Operation man-machine interface: Color touch panel, 18" Data collection: yes Facility and environment: Operation temperature: 15-25°C Relative humility: ≤75% N-2 for dry pump: Flow rate: 10 mL/min Pressure: 0.3~0.7 MPa (3~7kg/cm-2) Cooling water for heat exchange: Temperature: ≤ 30 °C Pressure: 0.2~0.4 MPa (2~4kg/cm2) Quality: City water Cooling water for dry pump: Flow rate: 3.5 L/min Temperature: ≤30°C Pressure: 0.2~0.4 MPa (2~4kg/cm2) Quality: City water (2) Operation manuals Installation instruction System module introduction Operation instructions Safety instructions (2) Repair and maintenance manuals PM Instructions Trouble shooting instructions Circuit diagram 208 VAC, 60 Hz, 3 Phase, 80A Currently warehoused 2003 vintage.

X-Ray Flourescence System Collimators: 2, 4, 8, 12, 20, 25 mil Applications: Single, Double and thickness & composition measurements Solution Analysis Auto Calibration Manual and Auto Measurement X-ray tube options vary, Mo target Be window, W target glass 50kv, 1ma capability Sample viewing, Color CCD camera Stage: Programmable X, Y, Z, stepper Single and dual filters, numerical filtering.

X-Ray Difractometer Includes: 2 Theta Goniometer Spellman DF 3 Generator Scintillation Detector Ortec Counting Electronics 8K Microprocessor.

Real time X-ray inspection system Includes 70 kv, 10 micron focal spot x-ray tube for ultra high resolution inspection Up to 500x geometric and 1,200x optical magnification X-Y-Z movement with 360 degree rotation and 45 degree tilt New GTI-60 Image Processing Software with 2-64 frame averaging and image download PC and monitor not included.

X-Ray Power Supply Block Typ: MSU 2420/05 5000VA, 50/60HZ 1997 vintage.

backscatter coating and plating thickness measurement instrument, stand, and source holders (not the sources), does not include probe.

X-ray machine Tube: 80 kV, 35 micron focal spot PC controlled Zoom lens camera with 4x - 50x magnification Motorized X-Y positioner GTI-1000 image processing software with 2-256 frame averaging, X-Y measurement, AVI video recording and image download 2011 vintage.

XRF system Sample changer with (150) cassettes Includes computer and software Tube installed in 2011 De-installed in 2012 Parts that need to be replaced: Gonio (2) Vacuum pumps 1998 vintage.

X-ray machine Mounted on table.

X-ray machine Tube current: 5 mA 220 V, 150 KVP 1990 vintage.

X-ray inspection system.

X-Ray Diffraction System Applications in analytical X-Ray diffraction in both scientific and industrial research environments X-Ray diffractometer has the following parts: Computer controller, PW3710 MPD control. PW2233/20 X-Ray tube Goniometer stage with a mount for wafers up to 4" diameter.

X-Ray fluorescence system With rotating anode target Helium compressor: CNA-21 Chiller: LN2-DIW X-Ray generator Power box Sweeping mode on wafer: Yes W-M and W-Lb: 15 mm From edge H.E.: 25 mm From edge SSD Equipped Spectrum: Failure 2007 vintage.

Emission regulation X-ray source.

X-Ray 2008 vintage.

XRD System Includes: Detector X,Y,Z Stage Controller card.

Wafer / Disk analyzer Without handler 1998 vintage.

Scanning system 125 V.