Wafer Testing And Metrology
1734 RESULTS FOUND FOR: used Wafer Testing And Metrology
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ADE / KLA / TENCOR: 350
Robot arms Part No. 353-071-0071 Arm: 022256-02 ASM P/N: 78-115406A05 Brief approxima... -
ADE / KLA / TENCOR: AFS 3220
Wafer surface measurement system. -
ALLWIN21: AWgage 200
Metal film metrology system, 4"- 8" Main frame Measurement head Non-contact sheet res... -
BRUKER / SLOAN DEKTAK: XT
Probe profiler, 4". -
BIORAD: PX 1
Foils microplate plate sealers 2014 vintage. -
CANON: LSF 500
Flatness tester Includes: Metal box Discs Lenses Fuses. -
CORNING / TROPEL: 128892-7000
Metrology testing systems Measure pole movement with nanometer accuracy 2003-2004 vin... -
DNS / DAINIPPON: LAW-815A
RTA System, 6" 1993 vintage. -
FOUR DIMENSIONS: CV92-A
Mercury probe CV mapper, 8" Embedded computer and a PC Drawer for receiving the wafer... -
FSM / FRONTIER SEMICONDUCTOR: FSM 413
Wafer thickness measurement system 2013 vintage. -
FARO: 3D Platinum
Measurement arm, 4" Control Station Platinum 4: Part no. CS-P0402-21 Touch screen com... -
HITACHI: VR-120/08S
Resistivity test system, 12" 2002 vintage. -
JMAR: Mirage S2610-01
Automatic wafer circuit inspection measurement system, 3-axis Objectives: 10x and 50x... -
ISIS SENTRONICS: SemDex 301-2
Wafer metrology system 2010 vintage. -
KLA / TENCOR / PROMETRIX: FT-500
Film thickness system. -
KLA / TENCOR / PROMETRIX: FT-750
Film thickness mapping system. -
KLA / TENCOR / PROMETRIX: NC 110 OMNIMAP
Film thickness measurement system, 4"-8". -
KLA / TENCOR / PROMETRIX: RS35E OmniMap
Chuck, 8" Flat monitor Printer Power conditioner Hardware: Vacuum: 300 mm Hg Pressure... -
KLA / TENCOR / PROMETRIX: RS-55
Resistivity mapping system, 5". -
KLA / TENCOR / PROMETRIX: UV 1050
Film thickness measurement system.