Used BRUKER / SLOAN DEKTAK (Wafer Testing And Metrology) for sale

The wafer testing and metrology equipment offered by BRUKER/SLOAN DEKTAK are highly regarded in the semiconductor industry. These systems provide comprehensive analysis and measurement solutions for surface roughness and film thickness on wafers. One notable advantage of BRUKER/SLOAN DEKTAK units is their high precision and accuracy. These machines utilize advanced technologies such as stylus profilometry and white light interferometry to capture precise measurements on the wafer surface. This level of accuracy ensures reliable data for process control and quality assurance. BRUKER/SLOAN DEKTAK offers a range of models to cater to different needs. For instance, the NT 3300 is a versatile system that enables non-contact measurement of height, roughness, and film thickness with sub-nanometer resolution. The XT series, on the other hand, provides advanced profilometry for thin films, step heights, and other critical measurements. The IIA system is designed for high-speed in-line wafer inspection, providing real-time analysis for production environments. These tools find applications in various industries, including semiconductor manufacturing, MEMS fabrication, and materials research. They offer quick and accurate measurements, helping companies streamline their processes, improve product yield, and ensure the integrity of their wafers. BRUKER/SLOAN DEKTAK's wafer testing and metrology assets are trusted tools for quality control and process optimization in the semiconductor industry.