Used LEITZ (Wafer Testing And Metrology) for sale

LEITZ is a leading manufacturer of wafer testing and metrology equipment widely used in the semiconductor industry. Their range of products includes analogues, such as their Advanced Spectroscopic Ellipsometers (ASE), which offer precise measurement capabilities for thin film characterization. These systems provide advantages like high-speed, non-destructive testing, and accurate characterization of film thicknesses, refractive indices, and surface roughness. One popular wafer testing system from LEITZ is the LIS (Leitz Integrated System), which combines multiple measurement techniques including spectroscopic ellipsometry, reflectometry, and scatterometry. The LIS system enables comprehensive wafer inspection and characterization, ensuring high quality and reliability of semiconductor devices. For metrology purposes, LEITZ offers the MPV-SP (Multiple Purpose Spectral Reflectometer). This system provides fast and accurate measurement capabilities for film thickness, refractive index, and critical dimensions. The MPV-SP is commonly used for process control and optimization in semiconductor manufacturing. LEITZ also offers the SP (Spectroscopic Ellipsometer) series, which provides high-precision measurement capabilities for film thicknesses and optical constants. These units are designed to fulfill the demanding requirements of various wafer fabrication processes. Overall, LEITZ wafer testing and metrology machines are known for their advanced technology, precise measurements, and reliable performance, helping semiconductor manufacturers to enhance their yield, improve process control, and meet the industry's ever-increasing quality standards.