Used GOM (Wafer Testing And Metrology) for sale

GOM, a renowned manufacturer, offers wafer testing and metrology equipment that play a vital role in ensuring the quality and precision of semiconductor wafers. These systems are designed to measure various surface parameters and characteristics of the wafers, enabling comprehensive testing and analysis. One of GOM's prominent products is the ATOS III Triple Scan system, which utilizes advanced 3D scanning technology to capture high-resolution surface data of wafers. This system offers quick and accurate measurements, allowing for efficient quality control during wafer manufacturing processes. It also provides comprehensive data analysis features for in-depth evaluation. Another notable system from GOM is the ATOS SO 4M, which is designed specifically for semiconductor wafers. This system integrates high-resolution scanning and offers detailed measurement capabilities, enabling assessment of critical features like film thickness, surface profile, and topography. It ensures reliable and precise testing results, contributing to enhanced wafer quality and production efficiency. GOM's wafer testing and metrology units have several advantages, including non-contact measurement techniques, high-speed data acquisition, and automation capabilities. These machines enable the inspection of wafers with complex geometries and can handle large volumes of data quickly. Furthermore, they provide traceable and repeatable measurement results, ensuring accurate evaluation of wafer properties and minimizing production defects. Overall, GOM's wafer testing and metrology tools, such as ATOS III Triple Scan and ATOS SO 4M, offer advanced and reliable solutions for comprehensive quality control and precise measurement of semiconductor wafers.