used Wafer Testing And Metrology - KLA / TENCOR / PROMETRIX (KT) for sale
CAE has broad access to semiconductor related equipment direct from fabs, often unavailable through other sources. CAE finds the best deals on used KLA / TENCOR / PROMETRIX (KT) wafer testing and metrology. CAE has 200 wafer testing and metrology currently available for sale from KLA / TENCOR / PROMETRIX (KT). You can choose from a selection of models, such as 6200 SURFSCAN, 6420 SURFSCAN or 7200 SURFSCAN. We’re accountable for every transaction — CAE will seek to collect as much information as you require to ensure that you receive the equipment in the condition that you are expecting. Send us your request to buy a used KLA / TENCOR / PROMETRIX (KT) wafer testing and metrology and we will contact you with matches available for sale.

50 RESULTS FOUND FOR: used KLA / TENCOR / PROMETRIX
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Non-pattern surface inspection system, 4"-8" PSL Calibration Defect sensitivity: 0.1 Micron (PSL STD...
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Unpatterned surface inspection system, 6"-8" Bare silicon wafers With films surface particles & defe...
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Patterned wafer inspection system Repeatability: < 3% Mean count: 500 Particles Diameter latex spher...
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Particle inspection station, 8" Patterned surface inspection system ARGON Laser Power supply: 208 V,...
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Patterned wafer inspection system, 6"-8" Double darkfield inspection tool SECS II/GEM Communication ...
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Stylus profiler.
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Film thickness probe system.
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Film thickness probe system.
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Film thickness probe system Power supply: 5000 VAC, 1 Phase.
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Metal film thickness meter system, 6" 1992 vintage.
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Resistivity mapping system, 6"-8" 1993 vintage.
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Resistivity mapping system, 6"-8".
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Mapping system.
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Resistivity mapping system.
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Resistivity mapping system, 2"-8" Cassette autoloader Wafer measures: up to 1264 Sites Resistance: <...
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Resistivity mapping system.
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Resistivity mapping system 1991 vintage.
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Resistivity mapping system, 8".
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Resistivity mapping system, 5"-8" Auto wafer transfer.
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Resistivity mapping system.