Used BRUKER (Wafer Testing And Metrology) for sale

Bruker is a leading manufacturer of wafer testing and metrology systems. They offer a range of analogues with advanced features and advantages for precise and efficient wafer testing. One popular model is the NP Flex system, which provides non-destructive testing for thin film characterization. This system uses spectroscopic ellipsometry to measure parameters like film thickness, refractive index, and roughness. It offers high-speed data acquisition and comprehensive analysis capabilities, making it ideal for research and development purposes. Another notable system is the Contour GT-X8, which is a versatile optical profiler for surface metrology. It employs white light interferometry to measure surface topography with sub-nanometer resolution. The Contour GT-X8 can accurately measure film thickness, step heights, surface roughness, and other surface features, making it suitable for a wide range of applications including semiconductor manufacturing, MEMS devices, and optical surfaces. For deep ultraviolet lithography, Bruker offers the DUVX210 metrology system. This tool provides critical dimension and overlay metrology for advanced semiconductor manufacturing processes. It uses imaging technology coupled with advanced algorithms to measure critical dimensions and overlay accuracy with exceptional precision, enabling tighter process control and improved device performance. Bruker's wafer testing and metrology systems are highly regarded for their accuracy, reliability, and advanced features. These systems play a crucial role in semiconductor manufacturing, research, and development by enabling quality control, process optimization, and yield enhancement. With their broad range of offerings, Bruker caters to the diverse needs of the semiconductor industry.