Used SEMILAB (Wafer Testing And Metrology) for sale

SEMILAB is a renowned manufacturer of wafer testing and metrology systems that offer advanced solutions for semiconductor manufacturing processes. Their products assure efficient quality control and enhance productivity in the industry. One of SEMILAB's popular products is the RT-110, an optical wafer metrology system that provides accurate measurements of wafer thickness and topography. It utilizes non-contact optical interferometry technology, which enables fast and precise inspection while minimizing damage to the wafers. This system is invaluable for quality control, process development, and yield enhancement. Another notable offering from SEMILAB is the Epimet, a comprehensive wafer characterization tool. It combines a range of measurement techniques such as optical reflectometry, ellipsometry, and sheet resistance mapping to provide in-depth information on various wafer properties. Epimet is particularly suitable for research and development as it enables detailed analysis of thin films, surface roughness, and electrical properties. To address the demands of the failure analysis market, SEMILAB developed the FAaSt 330A. It is an all-in-one system that integrates multiple measurement techniques like contactless voltage and current mapping, thermal imaging, and micro-spot resistance analysis. This allows for quick and accurate identification of failures in semiconductor devices, supporting efficient root cause analysis and problem-solving. Overall, SEMILAB's wafer testing and metrology systems offer numerous advantages, including high-precision measurements, non-destructive testing methods, versatile capabilities, and user-friendly interfaces. These systems find applications across various sectors of the semiconductor industry, including research and development, quality control, and failure analysis. SEMILAB's commitment to innovation and customer satisfaction has established them as a trusted provider of advanced metrology solutions.

4 results found
Filters
Clear All
Filters
4 results
Wafer Size
  • (1)
Vintage
  • (1)
  • (1)
  • (3)