Used RUDOLPH Waferview 320 #9223168 for sale

ID: 9223168
Vintage: 2006
Macro defect inspection system EFEM 2006 vintage.
RUDOLPH Waferview 320 offers state-of-the-art mask and wafer inspection technology for advanced process control across a variety of industries. This equipment can measure and evaluate a variety of wafer sizes, including 200mm, 300mm, and 450mm, and it supports up to eight cameras, each with its own unique viewing characteristics. Waferview 320 offers comprehensive pattern recognition technology that can detect discrepancies, critical flaws, and defects at the masking and wafer inspection stages. RUDOLPH Waferview 320 is capable of inspecting wafer patterns up to 0.3 microns in size with unmatched precision and accuracy. The system is equipped with a high-speed camera that can capture images at up to 400 fps, making it ideal for inspecting dynamic processes. The fully automated unit also features a sophisticated image-stabilization technology, which provides advanced image clarity and consistency. The software powering Waferview 320 is fully customizable, with a user-friendly interface for easy navigation and control. The machine allows for comprehensive data analysis, including graphical visualizations and statistical summaries of inspection results. Additionally, it incorporates complex algorithms to help ensure reliable results and facilitate efficient inspection processes. RUDOLPH Waferview 320 was designed with superior safety features, including an eye safety LED for users' protection. The tool also features a vacuum seal asset, as well as a dust-proof housing, to protect the wafer specimens during use. Overall, Waferview 320 is the ultimate mask and wafer inspection model for advanced process control. This equipment's advanced imaging capabilities, sophisticated software features, and comprehensive safety features make it invaluable in ensuring precise and accurate inspection results.
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