Used ANDO AF 8642 D1 #9099968 for sale

Manufacturer
ANDO
Model
AF 8642 D1
ID: 9099968
Vintage: 2004
Burn-in ovens Refrigerant: R-417A 200 VAC ± 10%, 50/60 Hz, 3 Ph 2004 vintage.
ANDO AF 8642 D1 is a high-performance burn-in equipment designed for the testing of integrated electronic components. It is capable of supporting up to 32 channels with an output of 3 A/Channel and up to 16 VDC/Channel. The system is equipped with a host computer that provides a user-friendly GUI interface and specialized software. It also includes a remote access server and networking capabilities to enable remote users to access the unit from any location. AF 8642 D1 burn-in machine has a testing time of two times (2x) up to 96 hours. This enables it to perform ideal functional testing, stress reliabilities, and wearout behavior simulation in as little as three days. The tool's optimized parameters can be adjusted to accommodate the requirements of the device under test, making it well-suited to a variety of test applications. ANDO AF 8642 D1 burn-in asset is designed with safety and flexibility in mind. It has built-in temperatures and over-temperature and overvoltage protection, reducing the chance of a component failure during testing. The model is also highly configurable, providing multiple monitoring and control features, including programmable alarm thresholds, real-time monitoring, and power management. It offers a range of other advanced features including gate drive measurement, crosstalk measurements, loop current measurement, dynamic current measurement, and pulse mode testing. AF 8642 D1 burn-in equipment is ideal for burn-in applications in fields such as automotive, industrial, and medical. Its efficient design and high performance make it reliable and cost-effective, ideal for use in industry today. The system also includes a robust library of built-in test and analysis functions that can be accessed at the press of a button. All in all, ANDO AF 8642 D1 burn-in unit provides a reliable, efficient, and cost-effective platform for testing and analyzing integrated circuits.
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