Used HERAEUS HEP 21 #31329 for sale

HERAEUS HEP 21 is a PC-based, stand-alone burn-in equipment for high-reliability component related applications. It is used for testing power devices like transistors, mosfets and IGBTs and other components used in critical circuitry. It can test parameters such as sub-3V/3A and DC voltages, as well as Resistance, Current and Leakage Current. HEP 21 system consists of a PC controller card, which has a slot for a standard ISA or PCIMMI extension card. The slot also has a dedicated power supply unit, AC-DC delta voltage, a potentiometer and an external switch for controlling the temperature operating range. The PC controller card has temperature measurement capability and includes a debugging port, voltage monitoring port and a temperature monitoring port. HERAEUS HEP 21 can be used to program and debug the components when connected to a PC using a serial port. It can also store a test sequence, which enables you to repeat tests on various components. It can measure the exact time to complete a test. HEP 21 unit has a graphical user interface that provides users with an easy to use interface for programming and controlling the tests. The GUI also includes information about the type of component and its standard test limits. HERAEUS HEP 21 machine also has an alarm function that will alert the user of any dangerous temperature operating conditions. HEP 21 tool is designed to operate with a wide range of operating environment including on-line operation, back-up/safety buzzwords, high-voltage/high current protection, and other integrated self-protection functions including VSWR, lightning/surge protection, and reverse polarity protection. It is designed to meet the stringent requirements of high-reliability electronics and power devices. HERAEUS HEP 21 asset offers superior performance and is able to provide accurate and reliable test results. It offers the ability to monitor and control the temperature operating range, as well as providing automatic test sequence switching and debugging, allowing for the highest standard for high-reliability component testing.