Used JEC / JAPAN ENGINEERING COMPANY P6502 #9145760 for sale

JEC / JAPAN ENGINEERING COMPANY P6502
ID: 9145760
Vintage: 2008
Burn-in ovens 2008 vintage.
JEC / JAPAN ENGINEERING company P6502 is a burn-in equipment specifically designed to assess the reliability of electronic components by subjecting them to a simulated temperature and voltage environment over an extended period of time. This system is suitable for testing a wide range of components, including bipolar, MOSFET and MOS capacitors. JEC P6502 unit features an adjustable test temperature range of 25°C to 125°C. Temperature homogeneity levels of 4°C or less and temperature accuracy of 0.5°CAE maintained thanks to its intelligent automatic self-calibration feature. It can also automatically log temperature data as the test progresses. The machine is equipped with sophisticated software and a user-friendly graphic interface for easy operation. It can be used to configure various parameters, such as test times, power settings, temperature settings and data logging. Additional features include a test monitoring tool which allows users to view the testing data in real-time, a comprehensive temperature control asset which allows the model to accurately maintain ambient temperature parameters, and more. JAPAN ENGINEERING company P6502 can be used to test various types of components such as FETs, high power transistors, power ICs, MOSFETs, MOS capacitors, resistors and more. It has a wide testing voltage range of 0 to 200V, and its advanced voltage control equipment ensures a stable voltage output even while the power supply may fluctuate. This system also allows users to conduct short-circuit tests as well as high and low temperature tests. P6502 also assists in providing comprehensive and detailed test information for components. The data collection and analysis features allow users to access testing information such as dwell time, meander line data, testing results, power source temperature, and more. This unit has been designed to reduce the time and cost of burn-in test cycles while meeting the highest standards of accuracy and reliability.
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