Used ADVANTEST 3767CG #187687 for sale

ADVANTEST 3767CG is an advanced automatic test equipment (ATE) designed for testing high speed, high frequency components and integrated circuits (ICs). It is an integrated test equipment that combines measurement and analysis capabilities in one compact system. It features a wide selection of reconfigurable hardware for a flexible and versatile testing environment. 3767CG can be configured to test PCBs, printed wiring assemblies, unit-level sub-assemblies and complete systems in a variety of testing applications. Its wide range of motion and multi-axis motion control capabilities enable high precision testing of targets such as pin-grid arrays (PGAs), ball-grid arrays (BGAs), multi-layer substrates (MLS), drive waveforms and floating nodes. Its integrated test environment also includes high-speed digital signal analysis, high-speed switching, in-circuit testing, boundary scan, machine-level voltage/current measurements, dynamic time domain and spectral measurements. ADVANTEST 3767CG supports an extensive range of analog and digital measurements, and can be configured for any of the popular fault locator systems. Its high speed switching channels support up to 10,000v and are capable of performing high speed parametric tests such as flying probe testing, insulation testing, and open/short testing. The switchers feature a number of other functions such as low source impedance, voltage and current measurements, as well as polarity control. Furthermore, 3767CG includes industry-leading instrument control and communication interface capabilities. It supports multiple communication protocols such as GPIB, Serial, Ethernet, and Universal Serial Bus (USB). In addition, it supports standard test interfaces for database and automated test control, and provides a range of macro commands for easy test sequencing and parallel control. ADVANTEST 3767CG is an ideal solution for testing high speed, high frequency applications and integrated circuits. Its integrated test environment provides extensive measurement and analysis capabilities, and its reconfigurable hardware provides users with a highly flexible testing environment. With its wide range of communications, instrument control and parallel control capabilities, this ATE is well-suited for advanced applications such as high accuracy fault localization.