Used ADVANTEST D 3186 #9085218 for sale

ADVANTEST D 3186 is an electronic test equipment used to test and analyze the performance of semiconductor devices. This multi-function test and measurement equipment is designed for use in semiconductor device characterization and characterization in modern production­al and research laboratories. It has high speeds, up to 6 GHz, and fast data throughput, up to 400 Mbytes/sec, giving it excellent performance when used with demanding electronic devices. D 3186 offers a wide range of testing and analysis capabilities for any application. It includes a variety of measurement, test and debug features with full real-time support. The test system includes powerful waveform analysis tools, such as timing analysis, wave-to-wave comparison, and measurement parameters. It also offers analog and digital waveform display and-signal conditioning. It can analyze and characterize signals such as power, frequency, and analoglevel. The unit also offers a wide range dimensional analysis for testing semiconductor device timing, current, and voltage characteristics. In addition, ADVANTEST D 3186 has a pacer synchronization feature that enables users to precisely measure the time taken to complete specific tests. It also includes a parallel monitor port that allows users to monitor the tester's operation from an external machine. The built-in remote control functions are also incredibly useful for remote operation or for controlling multiple testers. The tool also includes an intuitive graphical user interface that allows users to quickly set up test programs and view data on a visual display. This feature also enables users to view detailed data from multiple instruments if they are connected via an external bus. The asset can even monitor power consumption of multiple testers and other related equipment. D 3186 is a high-performance test and measurement model used to test and analyze modern semiconductor devices. Its advanced features make it ideal for use in research and production facilities. The equipment is incredibly reliable and easy to use, allowing users to quickly develop accurate tests and analyze complex electronic signals. Its wide range of testing and analysis capabilities make it a powerful tool for testing, analyzing, and characterizing semiconductor devices.