Used ADVANTEST D3286-70 #9090717 for sale

ID: 9090717
Error Detector, 12 Gb/s Generation of SDH/SONET frame patterns (mixed patterns) which are close to actual data 8M-bit memory, 31 stages for PRBS Multi-channel output : 2 data channels, 3 clock channels, and 7 sub-rate channels Cross point variable for output waveform Burst signal output Options: 70 = Mixed Pattern (SDH/SONET Frame Pattern) .
ADVANTEST D3286-70 is an advanced electronic test equipment used for high-speed, full-function testing of digital and analog ICs. It features a unique high-speed, on-chip testing capability that allows for accurate, fast, and consistent testing of a variety of different ICs. With its advanced features, D3286-70 is able to selectively detect abnormal chips while also providing detailed test results. ADVANTEST D3286-70 has a state-of-the-art scan testing architecture for superior performance and accuracy. It is equipped with a 32 256-channel or a 64 256-channel parallel memory access arrangement which is capable of handling a high test data throughput of 3.4 GB/s. Furthermore, it has a test frequency capability of over 15 GHz. It is also equipped with 10 high-speed comparators with a selectable detection range. Additionally, it features an automatic fault localization system which identifies errors via a recursive process. D3286-70 has a graphical user interface for easy test development and management. With its on-board data logging capability, it can record results, analyze them later on, and visualize them in real-time. Furthermore, it has a built-in test library which allows users to store and modify previously developed tests. It also features a test control and monitoring function for quickly setting and checking test parameters. ADVANTEST D3286-70 includes a high-speed probe and jumper system. These provide easy and accurate connections to IC pads with minimal loading. It also has a high-speed IC control unit which is able to communicate with the tester from up to 10 meters away. With its high-level automation capabilities, it allows users to perform IC testing without complex programming. In order to ensure accurate testing, D3286-70 is equipped with self-test capability and a calibration function. It also features a light wave detector which can detect and diagnose any subtle flaws in device performance. Lastly, it utilizes an AI-driven algorithm to ensure highly accurate test results. Overall, ADVANTEST D3286-70 is a one-of-a-kind IC tester which combines advanced features with excellent performance. With its top-notch test data throughput, high-speed comparators, fault localization system, and automated functions, it provides users with reliable and accurate testing experience and results. It is the perfect choice for those who require a high-performing yet user-friendly IC testing solution.
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