Used ADVANTEST Q8326 #9138085 for sale

ADVANTEST Q8326 is a high performance and flexible Automated Test Equipment (ATE) solutions for testing automotive electronic components such as semiconductor devices, logic memories, and optical networks. Q8326 is designed to test automotive components with a range of testing techniques such as Automatic Test Pattern Generation (ATPG), Laser Pulse Measurement (LPM), and Parametric Measurement Unit (PMU). ADVANTEST Q8326 utilizes a unique built-in, high speed, flexible switching matrix, which allows for testing of multiple devices in parallel. It has a wide range of switching test conditioners for testing powerful semiconductor devices like high-speed memory and logic devices. Q8326 supports a wide variety of digital and mixed-signal test solutions, as well as high-speed parallel testing. ADVANTEST Q8326 offers high accuracy, high speed, and high throughput capabilities, with a very accurate measurement and quick response time. Its accuracy is up to 2µV/ns and 5ppm/MHz for digital devices; and 200mV/100MHz and 4ppm/MHz for analog devices. The cycle time of the test is typically one millisecond, depending on the test pattern. The test instrument can generate a wide range of signal frequencies range from 500kHz to 10GHz. It also has an advanced, multi-channel programmable test bus system with dedicated I/O buffers to perform standalone automatic test. Q8326 has programmable trigger unit for both external and internal trigger signals for faster test coverage. It also supports a wide variety of automation hardware and software solutions for a total ATE solution. The instrument also supports a library of test routines for fast debugging and programmable test execution. Its user interface is easy to use to generate a customized test program. Overall, ADVANTEST Q8326 is a reliable and effective automated test equipment system to accurately measure and test automotive electronic components. It offers a wide range of testing techniques and high accuracy levels, while providing excellent performance, flexibility, and fast testing times.