Used ADVANTEST R3162 #9029408 for sale

ADVANTEST R3162
ID: 9029408
Spectrum analyzer, 9 KHz - 8 GHz.
ADVANTEST R3162 is an automatic test equipment (ATS) for the testing of semiconductor devices, devices that contain integrated circuits. It is a general purpose, highly flexibile test system that can apply and measure signals up to 3GHz. Designed with high versatility and automation, ADVANTEST R 3162 is capable of making accurate measurements and executing tests at high speeds. R3162 consists of a controller, mainframe, and various interface cards. The various types of interface cards include arbitrary waveform generator (AWG) cards, array multiplexer (AM) cards, digital pattern generator (DPG) cards, pulse pattern generator (PPG) cards, as well as cards for fixturing and measurement. This combination of cards enables R 3162 to perform a variety of tests that include wafer level production test, fault diagnosis, pulse peak current measurements, frequency domain measurements, and high speed mixed-signal measurements. ADVANTEST R3162 can accommodate a wide variety of test fixtures and probes. It is capable of testing both standard and custom devices. In addition, it has a shuttle hand fixture that makes loading and unloading test sites fast and efficient. ADVANTEST R 3162 can execute highly parallel tests using multiple tester ports, which reduces overall test time. The unit also offers strong data acquisition capabilities, with data acquisition rates up to 10,000 points per second. This capability is particularly useful for making rapid data logging and waveform analysis. The user-friendly software is designed to minimize setup time and maximize throughput. The software features a graphical user interface that provides intelligent wizards and a drag and drop workbench for creating tests quickly and easily. In addition, R3162 is equipped with an integrated debugger and tester manager, which allows the user to design, debug and monitor tests conveniently on one platform. Overall, R 3162 is a powerful, versatile testing machine that is ideal for semiconductor device testing applications. Its highly automated and flexible design enables it to accommodate a wide range of test fixtures and probes to meet the needs of the most complex device test requirements. Its intelligent software combined with its data acquisition rates also makes it a top choice for rapid data logging and waveform analysis.
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