Used ADVANTEST R3465 #167862 for sale

ADVANTEST R3465
ID: 167862
Spectrum analyzer, 8 GHz.
ADVANTEST R3465 is an electronic test equipment produced by ADVANTEST Corporation, Japan. It is a high performance, automated testing solution designed to provide fast and accurate testing of complex integrated circuits (ICs). R3465 is a complex digital equipment based on a 4-slot chassis and integrated high-density switching capability, providing a flexible platform for testing a wide variety of ICs. It supports on-board digital parameter measurement, in-circuit testing, and logic analysis functions to support a variety of high volume, precision testing needs. ADVANTEST R3465 features an array of high-performance instruments, including a waveform generator, square wave generator, and a frequency counter. It has a large variety of configurations for customizing the testing requirements for specialized ICs. It supports up to 64 small form factor DUTs per slot, allowing for quick and efficient testing of multi-pin ICs. For improved testing accuracy and speed, R3465 also includes a built-in oscilloscope, logic analyzer, and waveform/spectrum analyzer. ADVANTEST R3465 also includes a built-in flip-chip bond tester, a high-performance particle inspection system, and a native waveform capture unit. Combined with dedicated software, R3465 provides high accuracy and speed in a range of digital testing solutions. The machine supports internet connectivity, enabling users to easily connect ADVANTEST R3465 to LAN or cloud-based testing solutions. R3465 comes with an intuitive user interface for easy set up and operation. It is also upgradable with additional instruments and modules, allowing users to customize their setups to suit their testing needs. Overall, ADVANTEST R3465 is an excellent test tool designed for high-volume IC testing. It provides fast, accurate results and flexibility for a wide variety of applications. With its powerful instruments and easy to use interface, R3465 is an ideal solution for high-quality, production-level IC testing.
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