Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 11904 A #9294098 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 11904 A is a high-performance electronic test equipment designed for production testing and engineering applications. It features a comprehensive set of test functions and has a high performance architecture that ensures reliability for production testing of electronic components and devices. The unit includes an oscilloscope with four separate inputs and a frequency counter with input of 1 GHz and output of 25 MHz. The oscilloscope has a maximum input voltage of 500mV to 50V peak-to-peak, variable vertical sensitivity, selectable AC/DC coupling, and triggering from channel 1 or combined channels 1 and 2. The frequency counter measurement range is from 1kHz to 1GHz with a basic resolution of 100kHz. It features a sophisticated power measurement system with an accurate linearity of better than 0.20 dB over 90dB range, and a single pulse width from 0.1kHz to 1ms. The system can store up to 50 waveforms and measurements. Data can be recalled and displayed directly on the scope at any time. It also features a soft-key operation panel with 10x10 grid of quick-access buttons, making it easy to select and configure the desired parameters. The unit is designed to handle the most demanding production testing situations. It has a universal power adapter, a voltage level converter, and a surge suppressor. It can be configured for three-phase, single-phase, or AC/DC operation. It also includes a variety of different probes and accessories for a range of testing applications such as frequency response measurements, transient measurements, statistical sampling, sweep testing, and strobing. HP 11904 A is a rugged and reliable electronic test equipment with high-performance features that make it ideal for production testing and engineering applications. With its comprehensive test functions, sophisticated power measurement system, and versatile accessories, it provides the accuracy and reliability necessary for the most demanding electronic testing situations.