Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 33250A #9396254 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 33250A
ID: 9396254
Signal generator Frequency: 80 MHz.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 33250A is an electronic test equipment that is capable of generating and measuring both analog and digital signals and generating multiple signals accurately. It has a frequency range of up to 50MHz and provides both external and internal triggering options. It has two independent channels, each with separate amplitude, offset, and DC bias controls, allowing for optimization of signal creation. HP 33250A features numerous built-in functions for waveform creation and analysis, including sine, square, triangle, pulse, ramp, and DC voltage waveforms. It also offers an arbitrary waveform generator with up to two million points of 16-bit resolution waveform generation and editing capability. The waveform generator can be synchronized with an external trigger source for higher accuracy applications. AGILENT 33250A also offers comprehensive signal measurement functions for both analog and digital signals. It provides a high-resolution analog-to-digital converter and an analog comparator that can detect analog signals with a high resolution. It also offers basic statistics functions, such as Maximum, Minimum, Mean, Standard Deviation, and RMS. 33250A furthermore comes with a high-performance digital design module, allowing users to generate and analyze digital signals with higher resolution. It provides Waveform Anatomy capability, allowing users to calculate high-level digital parameters, such as PDDQ/PDDQDQ, Jitter, and the Eye Diagram. Finally, HEWLETT-PACKARD 33250A offers a convenient and user-friendly interface for accessing all of its capabilities, featuring an LCD display, a tactile keypad, and the ability to interface with a computer via USB, Ethernet, or GPIB ports. With its flexible signal creation and analysis functions, KEYSIGHT 33250A is an ideal choice for applications such as EMI troubleshooting, circuit debugging, testing embedded systems, and oscilloscope replacement.
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