Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4145A #106620 for sale

HP/AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4145A Semiconductor Parameter Analyzer is the latest in a line of modern, high-performance, high-reliability test equipment used for measuring a variety of electrical parameters on semiconductor devices. HP 4145A offers a powerful, highly versatile platform for advanced parameter measurement applications, such as characterization and parametric testing of any type of semiconductor wafers, chip carriers, and discrete components. AGILENT 4145A combines precision and accuracy with a wide range of functions and powerful test capabilities. It is a fully automated test equipment capable of performing a complete range of measurements including temperature coefficient, leakage current, stress & breakdown tests in a variety of temperature ranges. The system features advanced vector signal analysis (VSA) and vector network analyzer (VNA) capabilities, and has numerous optional applications available. 4145A offers excellent measurement accuracy, advanced repeatability, excellent measurement speed, and comprehensive unit capabilities. The instrument offers a variety of measurements including DC voltage, DC leakage current, breakdown voltage, jitter, noise and AC/RF measurements. The machine also comes with a variety of optional accessories such as extended memories, expansion cards, and upgrade kits to enhance the performance and features of the instrument. Furthermore, KEYSIGHT 4145A has a variety of advanced capabilities including test modes like constant current, constant voltage, temperature controlled, or series-mode testing, automated test sequencing and data logging, data interfaces for easy data acquisition and control, and multiple peripheral interfaces for easy integration with other test systems. HEWLETT-PACKARD 4145A is an ideal choice for comprehensive and accurate testing of any kind of semiconductor device on the production line. Its sophisticated capabilities make it an attractive choice for both laboratory researchers and industry applications. Its modern design, advanced capabilities, and comprehensive tool design make it a dynamic tool for testing and characterizing all types of semiconductor devices.