Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4145A #293652128 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4145A is an automated precision semiconductor parameter analyzer designed to test and characterize the electrical behavior of semiconductor devices. It features a focus on accuracy and a high level of device automation. HP 4145A offers four different measurement modes to accommodate a variety of device configurations, and is compatible with a wide range of device packages and probes. The analyzer is designed to offer a breadth of capabilities for DC and pulsed measurements of device characteristics. It features a high-speed memory for data storage as well as a vast selection of built-in display plot types for quick analysis and a range of analytical tools for more advanced characterization. The unit is equipped with a user-friendly interface, with programmable subroutines and a script language for quick setup and automation of measurement sequences. AGILENT 4145A is powered by a built-in digital signal processor (DSP) that offers a high sampling rate and fast settling times when measuring devices with fast transients. It integrates a step-voltage (DC) measurement capability as well as frequency sweep, time sweep and current sweep modes to characterize frequency responses, transient responses and pulse characteristics with accuracy. The instrument also offers dedicated linear and nonlinear programming functions, allowing users to model and analyze test results in real-time for efficient analysis. The analyzer offers comprehensive temperature testing, with multiple thermocouple types and a dedicated controller for temperature management. It measures the effect of temperature on a device's performance and parameters, allowing users to examine temperature-dependent characteristics such as leakage current, breakdown voltage and power dissipation. For reliable and reproducible measurements, KEYSIGHT 4145A comes with ESD and latchup protection, open and short detection as well as contact and leakage checking features. The instrument is suitable for a large range of device structures, from MOSFET to bipolar, and is designed for use in the qualification and testing of integrated circuits, including dynamic random access memories (DRAMs) and flash memories. Overall, HEWLETT-PACKARD 4145A offers an efficient and reliable platform for semiconductor tests and device characterizations. It is equipped with advanced measurement capabilities and a range of helpful features, allowing users to obtain accurate results quickly and easily.