Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4155A #9212047 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4155A is an electronic test equipment used for measuring and analyzing an array of electrical properties of semiconductor materials and devices. This highly sophisticated equipment utilizes a variety of electrical signals to analyze device parameters such as transconductance, capacitance, current-voltage characteristics, and output resistance. It provides a complete solution for accurately measuring, analyzing, and characterizing electrical properties of semiconductor materials and devices. HP 4155A consists of two main components - the mainframe and the control unit. The mainframe houses the electronic measurement equipment and includes magnetic shielding, a vacuum chamber, and thermal ramp control. It also features a wide range of analog input, digital output, and wireless communications interfaces. The control unit acts as the interface between the user and the mainframe. It provides a graphical user interface configured to collect, analyze, and display the acquired data and to monitor the performance of the instrument's electrical components. Additionally, AGILENT 4155A can be interfaced with computers running specialized hardware and software for data acquisition and analysis. HEWLETT-PACKARD 4155A's comprehensive capabilities, excellent ease of use, accurate and reliable measurement results, and compatibility with advanced software and hardware make it an ideal choice for many applications and laboratories. The system operates with two voltages of either 0V to ±20 V or 0V to ±40 V enabling the measurement of a large range of device parameters. This systemuses four independent full-range inputs for high-accuracy measurements of small signals, power devices, and thin films. Moreover, it incorporates a grounded source four-point probe, which isolates device measurement from environment influences, and four independent outputs for characterized performed measurements. The high-performance analyzer is capable of performing a wide array of transistor microwave parameters, capacitance-voltage (C-V) measurement, transient response testing, and semiconductor parameter extraction. 4155A also offers a variety of unique features such as automatic threshold mode switching, intelligent surface field visualizers, and automated parameter extraction process. This system gives users the flexibility to set up their parameters according to their needs with custom scripts and creates log files for easy analysis and review. In short, KEYSIGHT 4155A is an indispensable tool for any laboratory or engineer looking to make accurate and reliable measurements of semiconductor devices and materials. Its extensive capabilities, high-accuracy measurements, and user-friendly interface offer perfect solutions for complex applications.