Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4155C #293592248 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4155C is a precision semiconductor test equipment, designed to provide accurate, repeatable measurements of semiconductor devices. It offers a wide range of applications from basic device characterization to complex process simulations. With its two-channel mainframe, the system provides the highest speed and precision in many device and process analysis tasks. The unit is capable of measuring the electrical characteristics of semiconductor devices and other fine structures with high accuracy and repeatability. High-speed and parallel measurements are made with the systemHP 4155C digital computer, facilitating fast and precise measurements. The machine also provides integrated power supplies and pulse generators, enabling accurate measurements of devices as well as easy and fast programming of device test patterns. Suitable for complex process simulations, device analysis, and high-speed process integration, the tool has a variety of built-in test suites available. Additionally, the asset includes the ability to program user-defined Automatic Test Programs, allowing for the testing and evaluation of any number of parameters in a very short period of time. This feature greatly increases accuracy and efficiency, as well as providing valuable feedback to improve and characterize the device. AGILENT 4155C has a combination of optical and thermocouple probe heads to measure temperature, resistance and capacitance of small areas. An optional Headstage is available for performing direct current (DC) measurements and current source measurements. The optional 4155C Software includes a suite of over 30 configurable measurements and test routines. By using the software, users can easily create, modify, and execute test programs and set up measurement parameters quickly and efficiently. HEWLETT-PACKARD 4155C is designed to meet a wide range of applications, offering an integrated package of electronics and software. As a high-performance and cost-effective semiconductor test model, it is ideal for a wide range of characterization, verification, and fault isolation tasks in the semiconductor industry. Its combination of ability, test speed, precision, and reliability make it one of the most versatile test systems on the market.