Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4155C #293661396 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4155C is a four-point, precision semiconductor device analyzer. It is designed to accurately measure the electrical characteristics of a variety of semiconductor devices. This analyzer features easy-to-use front-panel operation, remote control via a LAN or GPIB interface, and numerous built-in features that eliminate many of the complexities inherent in traditional testing. HP 4155C is equipped with 4-channel testing capability and fully programmable functions such as auto-zeroing, offset compensation, bias/excess control, gap test, DUT protection, scan time and open/short calibration. It provides direct voltage and current measurements and accurate small-signal parameters both in DC and low-frequency AC operation. AGILENT 4155C offers a wide range of test functions, covering both dc and low-frequency AC measurement and test programs. It also features an easy-to-use menu-driven graphical user interface to make setup quick and easy. Its large scale integrated switching system allows multiple device tests to be set up for individual characterization. KEYSIGHT 4155C is designed to operate in both laboratory and on-field applications. The device has an integrated electrolytic capacitor depletion module that allows for voltage standoff. It also allows for remote access via LAN or GPIB interfaces for remote setup and data collection. The device features a large sample holder with a variety of multi-sample adapter plates for fast testing of multiple devices. The analyzer can be configured with up to four sets of bias and sense source amplifiers for current, voltage, power and resistance measurements in a wide range of applications. 4155C also includes a curve tracer function that accurately displays the device transfer characteristics graphically, enabling quick and straightforward evaluation of its performance. Furthermore, advanced analysis functions such as AC small-signal parameters, depletion-mode characterization, and charge-pumping measurements are also available. With its integrated software and acquisition modules, it enables the user to transform acquired data into practical, meaningful results in real time. Overall, HEWLETT-PACKARD 4155C is an advanced and highly versatile electronic test equipment for semiconductor device characterization and analysis. Its wide range of functions, high-precision measurements, and remote control and data acquisition capabilities make it an ideal tool for both laboratory and field service applications.