Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4155C #9000408 for sale
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ID: 9000408
Semiconductor parameter analyzer
General Features:
Cost-effective, accurate laboratory bench top parameter analyzer
4x Medium-power SMU, 2xVSU and 2xVMU
Fill-in-the blanks front panel operation
Includes Desktop EasyEXPERT software for PC-based GUI instrument control
Measurement Capabilities:
10 femtoamp and 0.2 microvolt measurement resolution
QSCV, Stress Mode, Knob-sweep, and Stand-by functions
+/- 200 Volts and +/- 1 Amp High-Power SMU, Pulse Generator capabilities available by optional 41501B
SMU Measurement Resolution:
Voltage: 2 V
Current: 1 fA
SMU Measurement Accuracy:
Voltage: 200 V
Current: 20 fA
SMU pulse width: 500 s/100 ms
VMU:
Resolution: 2 V
Accuracy: 200 V
VMU (differential):
Resolution: 0.2 V
Accuracy: 10 V
Dual High Voltage Plus Generator:
Voltage range: +/- 40V
Output current: +/- 200 mA
Minimum pulse width: 1 s
Minimum pulse period: 2 s.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4155C is a versatile and powerful semiconductor device test equipment. It has a frequency range of DC to 30 MHz, and is designed to be used in research and development laboratories, as well as production lines. HP 4155C provides users with a wide range of features and capabilities, making it a great choice for testing the quality and performance of semiconductor devices. It offers four input channels, allowing users to simultaneously measure multiple devices at the same time. It also provides high resolution, stable, low-noise measurements with a wide variety of device characteristics and measurement capabilities such as diode capacitance-voltage (C-V), breakdown voltage, drain-to-source resistance (Rds), mobility, current-gain bandwidths, threshold voltage, permittivity, charge neutrality, and more. Additionally, it features a graphical user interface which allows users to easily view and analyze results as well as to speed up data processing. AGILENT 4155C is also designed with a number of safety features, including a protective housing which helps to protect the system from electrostatic discharge (ESD) and other environmental hazards. It also has built-in diagnostics and battery-backed memory to help ensure ongoing accuracy and reliability. For more advanced users, 4155C provides a high level of programmability, enabling users to customize and automate test procedures. Its software-based programming enables users to control and store test parameters, optimize test conditions, and build custom programs with greater ease. It also includes an advanced trigger unit which allows users to detect and measure complex events with higher accuracy, and also to take more complex measurements. Overall, HEWLETT-PACKARD 4155C is a robust and reliable semiconductor device test machine which offers reliable and accurate results, advanced customization, and enhanced safety features. It is ideal for measuring device qualities, optimizing device characteristics, and automating test procedures, making it an excellent choice for research and development, production, and more.
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