Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4156C #293814060 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4156C is a multi-functional test system used for the semiconductor device characterization and parametric testing. It is made up of a Main frame unit and four parameter modules connected together with a mainframe interface card and a power terminal block. HP 4156C features a three-terminal probe (V, I, R), a four-electrode probe, and two kelvin connection probe assemblies. It has versatile computer control capabilities, allowing it to be used for high-precision parametric testing of semiconductor device performance over a wide range of bias conditions. AGILENT 4156C has a low noise output stage, allowing for high resolution measurements of device characteristics such as voltage and current over a broad frequency range. The four parameter modules offer flexibility allowing high-level control of bias voltage and current as well as the application of various pulse waveforms, discrete logic levels and combinations of logic signals. Additionally, it features state-of-the-art digital features such as current-sense integration, maximum and minimum bias current level memory, alarm limit settings, and instrument calibration. 4156C has a variety of measurement parameters such as voltage, current, and pulse timing available from its parameter modules. For semiconductor device characterization, it is capable of both DC and AC parameter measurements. It is also capable of performing parametric tests such as input capacitance measurements, output capacitance measurements, reverse leakage current measurements, forward current leakage measurements, switching time measurements, and noise measurements. It is capable of performing parametric testing of dielectric and oxide layers with absolute accuracy, and is capable of very fine resolution on waveform measurements. Additionally, HEWLETT-PACKARD 4156C has the capability of directly measuring current-sense voltages from a semiconductor device. KEYSIGHT 4156C offers a variety of interface and connection configuration options. It can be connected to a remote computer utilizing either GPIB or RS-232 serial protocols. It has an available remote monitor interface for acquiring measurement results from any computer terminal, while local control is also available utilizing its onboard keyboards. It is also compatible with a variety of data acquisition systems. Overall, AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4156C is an advance multifunctional test system ideal for semiconductor device characterization and parametric testing. It features high accuracy and resolution, versatile configuration and connection options, and ease of use. This makes it the perfect choice for modern semiconductor device characterization and parametric testing needs.