Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4263A #9142239 for sale

AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4263A
ID: 9142239
LCR meter.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4263A is a high-performance electronic test equipment designed for quick and accurate testing of semiconductor devices and components. It is one of the most widely used tools in the industry for electrical characterisation and is frequently used to measure the characteristics of semiconductors, passive components, and other electronic components and materials. HP 4263A has a wide range of measurement capabilities. It is capable of measuring current, voltage, power, resistance, capacitance, inductance, frequency, and temperature. It can also measure the electrical parameters of semiconductor materials and devices. Furthermore, this test equipment can be used to measure the noise levels of components and their respective temperature coefficients. AGILENT 4263A is versatile and is suitable for many different types of testing applications. It has a intuitive and easy to use user interface, which allows the user to perform repeatable and consistent measurements. It is capable of high accuracy measurements, with a wide range of precisions available, thanks to its patented measurement methods. HEWLETT-PACKARD 4263A is designed with many features to ensure accurate measurements and ease of use. It has multiple test fixtures for different component types and connection methods, as well as a wide range of instruments like a frequency counter, logic analyser, digital voltmeter, and sourcemeter. It also has an automatic measurement scripting tool for quick and easy testing. KEYSIGHT 4263A has a wide range of accessories and options to make it adaptable for different applications. It has multiple output connections, such as BNC, USB, and GPIB, as well as multiple input connections for signal conditioning. It also features a heatsink for temperature regulation and an isolated power supply to ensure correct operation. Overall, 4263A is an invaluable tool for characterisation of semiconductor materials and devices. Its versatile design, user friendly interface, and wide range of instruments and options make it suitable for a variety of different testing applications.
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