Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4395A #9294197 for sale
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ID: 9294197
Spectrum network impedance analyzer
HP brand, has defect under 30KHz range.
AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 4395A is a multi-mode microwave network analyzer designed to provide accurate, repeatable S-parameter measurements. This instrument features an easy to use GUI with intuitive keypad controls. It supports automated measurements of transmission and reflection parameters as well as mixed-mode measurements. Additionally, users have the ability to connect through a PC for remote control and data processing. HP 4395A is capable of measuring both linear and nonlinear parameters over the frequency range of 100 kHz to 3.6 GHz. Its stimulus frequency accuracy is 0.01Hz and its frequency resolution of 0.001 Hz. This instrument utilizes two internal synthesizers designed to produce a low phase-noise output signal with a dynamic range of 97 dB. Additionally, it features several built-in tools for complex compensating networks, as well as for troubleshooting and system debugging. AGILENT 4395A comes equipped with anROHM probe which provides a high degree of sensitivity and accuracy.Its software package offers a comprehensive range of measurement capabilities including loop measurements, noise figure measurement, system gain compression measurement, and channel balance measurement. Additionally, this analyzer supports a variety of calibration techniques and features a digital video display which allows users to view warning messages, measurement parameters, and diagnostic information. Finally, 4395A comes with an expansive library of remote commands which allows for instrument control over a GPIB interface. Additionally, the device can be easily adapted for automated measurements with its multiple output power options and remote control capability. This network analyzer is also designed for minimal power consumption, with a maximum power consumption of 200 watts. In all, KEYSIGHT 4395A is an advanced device, designed to provide accurate, repeatable S-parameter measurements with minimal downtime.
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