Used AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 43961A #9214233 for sale
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AGILENT / HP / HEWLETT-PACKARD / KEYSIGHT 43961A is a high-performance electronic test equipment that can be used to measure and analyze electrical signals. It has characteristics such as fast switching speeds, high input impedance, and wide input ranges, making it ideal for a variety of electrical test applications. HP 43961A is a 40-channel differential voltage probe that allows for simultaneous measurements. Its maximum input voltage is 500 millivolts, and it can measure voltage signals over a wide range of frequencies from 10 kHz to 75 MHz. The measureable frequency response of AGILENT 43961A is ±3 dB for frequencies that range from 10 kHz to 20 MHz, and it has a typical input impedance of 1 Mohm. The device boasts high accuracy of less than 1%, and its switching speeds are said to be greater than 10 ns, allowing it to accurately measure signals with fast rise and fall times. KEYSIGHT 43961A is a very precise and versatile instrument, as it offers the user four different measurement modes: peak-peak, RMS, MAX, and MIN. The peak-peak mode provides peak-to-peak measurements for up to 20 signals, while RMS, MAX, and MIN modes provide full-wave rectified RMS values for each signal, along with maximum and minimum readings. Its high-resolution display provides easy-to-read measurement data, with a total accuracy of 0.2%. In addition to its measurement capabilities, HEWLETT-PACKARD 43961A also features a power line frequency offset, allowing users to fine-tune their measurement setting to either 50 Hz or 60 Hz, depending on the application. The device is also equipped with overvoltage and overcurrent protection, which helps prevent damage to the device caused by electrical overloads. Overall, 43961A is an excellent choice for the user seeking to measure and analyze electrical signals. Its variety of features, such as its fast switching speeds, wide input ranges, high input impedance, and power line frequency offset, make it an ideal tool for a variety of test applications.
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